Adding an "elastic layer" to the capacitor terminal electrode effectively absorbs external stress and reduces the probability of occurrence of cracks.
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Internal cracks in the chip ceramic capacitor can cause serious damage. If the chip-type ceramic capacitor is subjected to shear stress during the PCB assembly process, a plate crack will be generated inside the ceramic magnet. These cracks may penetrate the inner positive and negative electrode layers inside the capacitor, which may lead to short circuit. risk. A typical plate bending failure crack pattern is shown in the figure below. These short-circuit modes may cause the capacitor to overheat and cause severe burn-out melting.
Actual sample picture:
This kind of damage is mainly caused by the shear stress of the plate-formed parts, which may not be visible from the appearance. It is generally necessary to make a section of the part to confirm the existence of such damage.
SMD multilayer ceramic capacitors often produce cracks during paneling, which is mainly caused by the vibration of the blade.
He Shentang developed the “SuperTerm†series of flexible terminal electrodes (the suffix with the TX letter in the principle of material number coding). This type of terminal electrode has an additional “elastic layer†structure, which can effectively absorb external stress and reduce The probability of cracking increases the reliability of the overall product. Most of the "SuperTerm" series of flexible terminal electrodes are used on circuits with strict requirements on the quality of chip capacitors, such as automotive electronics, high temperature environments, power lines, and TFT-LCD inverters.
TX products
Reliability / durability comparison
In the destructive anti-folding test, the PCB will continue to bend until the chip capacitance is destroyed. In this simulation comparison experiment, it can be found that there is no crack in the ceramic structure in the product with flexible tip design. Instead, it tears from the silver layer.
When the flexible end SuperTerm series products are damaged in the plate bending test, the failure mode is the open circuit mode. Generally, the open or short circuit mode of the terminal electrode will be generated. The elastic layer in the flexible tip SuperTerm series can be seen in the cross-section, and its composition contains "polymer silver" to produce this elastic effect.
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